Atomic Force Microscopy/Scanning Tunneling Microscopy 2

by Samuel H. Cohen

Book Overview

This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1475793278
• ISBN13: 9781475793277
• Release Date: June 2013
• Publisher: Springer
• Length: 250 Pages
• Weight: 1.02 lbs.
• Dimensions: 0.6" x 7.0" x 10.0"