Atom Probe Microscopy

by Baptiste Gault, Michael P. Moody, Julie M. Cairney, et al.

Book Overview

Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is...

• Format: Paperback
• Language: English
• ISBN: 1489989390
• ISBN13: 9781489989390
• Release Date: June 2014
• Publisher: Springer
• Length: 396 Pages
• Weight: 1.30 lbs.
• Dimensions: 0.9" x 6.1" x 9.2"