Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

by Harald Fuchs

Book Overview

The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 364209869X
• ISBN13: 9783642098697
• Release Date: November 2010
• Publisher: Springer
• Length: 236 Pages
• Weight: 0.91 lbs.
• Dimensions: 0.6" x 9.2" x 6.1"