Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

by Yuejin Hou, Zhenghao Gan, Cher Ming Tan, et al.

Book Overview

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.

To help readers cope with the increasing sophistication of FEMs' applications...

• Format: Hardcover
• Language: English
• ISBN: 0857293095
• ISBN13: 9780857293091
• Release Date: March 2011
• Publisher: Springer
• Length: 152 Pages
• Weight: 0.80 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"