Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Philippe Pougnet, Pierre-Richard Dahoo, Abdelkhalak El Hami

To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering...

• Format: Hardcover
• Language: English
• ISBN: 1786306409
• ISBN13: 9781786306401
• Release Date: March 2021
• Publisher: Wiley-Iste
• Length: 256 Pages
• Weight: 1.16 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"