Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations

by Sunil P. Khatri, Rajesh Garg, Sunil P Khatri

Soft Errors.- Analytical Determination of Radiation-induced Pulse Width in Combinational Circuits.- Analytical Determination of the Radiation-induced Pulse Shape.- Modeling Dynamic Stability of SRAMs in the Presence of Radiation Particle Strikes.- 3D Simulation and Analysis of the Radiation Tolerance of Voltage Scaled Digital Circuits.- Clamping Diode-based Radiation Tolerant Circuit Design Approach.- Split-output-based Radiation Tolerant Circuit...

• Format: Hardcover
• Language: English
• ISBN: 1441909303
• ISBN13: 9781441909305
• Release Date: November 2009
• Publisher: Springer
• Length: 212 Pages
• Weight: 1.12 lbs.
• Dimensions: 0.6" x 6.1" x 9.2"