Analog IC Reliability in Nanometer CMOS

by Elie Maricau and Georges Gielen

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune...

• Format: Paperback
• Language: English
• ISBN: 1489986308
• ISBN13: 9781489986306
• Release Date: June 2015
• Publisher: Springer
• Length: 198 Pages
• Weight: 0.68 lbs.
• Dimensions: 0.5" x 6.1" x 9.2"