An Introduction to Surface Analysis by XPS and AES

by John F. Watts and John Wolstenholme

Book Overview

Provides a concise yet comprehensive introduction to XPS and AES techniques in surface analysis This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer...

• Format: Hardcover
• Language: English
• ISBN: 1119417589
• ISBN13: 9781119417583
• Release Date: November 2019
• Publisher: Wiley
• Length: 288 Pages
• Weight: 1.27 lbs.
• Dimensions: 0.7" x 6.0" x 9.1"