Advances in X-Ray Analysis: Proceedings of the Eleventh Annual Conference on Application of X-Ray Analysis Held August 8-10, 1962

by Marie Fay and William M. Mueller

The torrential flow of technical information appearing in the world sources of literature is creating concern and apprehension among scientific people at all levels. It is extremely difficult to keep... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 146848785X
• ISBN13: 9781468487855
• Release Date: June 2012
• Publisher: Springer
• Length: 480 Pages
• Weight: 1.88 lbs.
• Dimensions: 1.0" x 7.0" x 10.0"