Advances in Reliability

by Asit P. Basu

This volume reviews recent developments in reliability theory. The papers contain results on a broad spectrum of topics, including: the role of information theory in reliability analysis; macroscale activation energy in integrated circuit reliability; and the problem of masked system life data.

• Format: Hardcover
• Language: English
• ISBN: 0444896457
• ISBN13: 9780444896452
• Release Date: May 1993
• Publisher: North-Holland
• Length: 482 Pages