Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope Volume 159

by Peter W. Hawkes

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.

• Format: Hardcover
• Language: English
• ISBN: 0123749867
• ISBN13: 9780123749864
• Release Date: December 2009
• Publisher: Academic Press
• Length: 320 Pages
• Weight: 1.75 lbs.
• Dimensions: 1.3" x 6.2" x 9.0"