Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience

by Jian Min Zuo, John C H Spence, John C.H. Spence

Book Overview

This volume expands and updates the coverage in the authors' popular 1992 book, Electron Microdiffraction. As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy. Special attention is given to electron diffraction and imaging, including high-resolution TEM and STEM imaging, and the application of these methods to...

• Format: Paperback
• Language: English
• ISBN: 1493982494
• ISBN13: 9781493982493
• Release Date: June 2018
• Publisher: Springer
• Length: 729 Pages
• Weight: 2.73 lbs.
• Dimensions: 1.4" x 9.2" x 6.2"