Advanced Trace Analysis

by Susanta Lahiri

Written by eminent scientists, Advanced Trace Analysis, this textbook discusses plethora of topics, including using statistical approaches to verify trace element analysis data, the trace analysis techniques like ICPMS and XRF, ion beam analysis technique and the speciation analysis of uranium relevant to waste disposal and management.

• Format: Hardcover
• Language: English
• ISBN: 8184870299
• ISBN13: 9788184870299
• Release Date: January 2010
• Publisher: Narosa Publishing House
• Length: 188 Pages
• Weight: 1.30 lbs.
• Dimensions: 0.6" x 7.3" x 9.5"