Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Alberto Bosio, Patrick Girard, Luigi Dilillo

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called...

• Format: Paperback
• Language: English
• ISBN: 1489983147
• ISBN13: 9781489983145
• Release Date: September 2014
• Publisher: Springer
• Length: 171 Pages
• Weight: 0.60 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"