Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by C.E. Fiori, David C. Joy, Dale E. Newbury, et al.

Book Overview

This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1475790295
• ISBN13: 9781475790290
• Release Date: June 2013
• Publisher: Springer
• Length: 454 Pages
• Weight: 1.39 lbs.
• Dimensions: 1.0" x 6.0" x 9.0"