Aberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction (2nd Edition)

by Rolf Erni and Erni Rolf

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional...

• Format: Hardcover
• Language: English
• ISBN: 1783265280
• ISBN13: 9781783265282
• Release Date: May 2015
• Publisher: Imperial College Press
• Length: 432 Pages
• Weight: 1.81 lbs.
• Dimensions: 0.7" x 6.3" x 9.2"