- CMOS Digital Integrated Circuits Analysis & Design
- Hot-Carrier Reliability of MOS VLSI Circuits (The Springer International Series in Engineering and Computer Science)
- Extreme Low-Power Mixed Signal IC Design: Subthreshold Source-Coupled Circuits
- Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
- Nanosystems Design and Technology
- Garry Mitchell
- John C. Mallinson
- G.E. Alan Dever
- Jeff W. Lichtman
- Eric Margenau
- Brian J.L. Berry
- Kathleen A. Lipinski
- Oliver Sims
- M. Necati Ozisik
- Thomas Ewing French
- Robert A. Lipinski
- Peter E. Gise
- William M. Hancock
- Richard C. Linger
- Judith Landau-Stanton
- Michael C. Newman
- Richard J. Gross
- Mark Wolverton
- Douglas R. Holberg
- John E. Cronan Jr.